Semiconductor test and reliability qualification equipment supplier Aehr Test Systems of Fremont, CA, USA has released two new enhancements for its FOX-P family of wafer-level test and burn-in systems – the FOX Bipolar Voltage Channel Module (BVCM) and Very High Voltage Channel Module (VHVCM) options – which enable advanced capabilities for silicon carbide (SiC) and gallium nitride (GaN) power semiconductors...
Source: https://www.semiconductor-today.com/new ... 1022.shtml